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The Resource Frontiers in Optical Methods : Nano-Characterization and Coherent Control, edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, (electronic resource)

Frontiers in Optical Methods : Nano-Characterization and Coherent Control, edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, (electronic resource)

Label
Frontiers in Optical Methods : Nano-Characterization and Coherent Control
Title
Frontiers in Optical Methods
Title remainder
Nano-Characterization and Coherent Control
Statement of responsibility
edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno
Creator
Contributor
Editor
Subject
Language
eng
Summary
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan
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Image bit depth
0
Literary form
non fiction
Series statement
Springer Series in Optical Sciences,
Series volume
180
Frontiers in Optical Methods : Nano-Characterization and Coherent Control, edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, (electronic resource)
Label
Frontiers in Optical Methods : Nano-Characterization and Coherent Control, edited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, (electronic resource)
Link
http://libproxy.rpi.edu/login?url=http://dx.doi.org/10.1007/978-3-642-40594-5
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Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
State-of-Art of Terahertz Science and Technology -- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films -- Single Photon Counting and Passive Microscopy of Terahertz Radiation -- Coherent Phonons in Carbon Nanotubes -- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation -- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures -- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy -- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring -- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique -- Terahertz Light Source Based on Synchrotron Radiation -- Terahertz Synchrotron Radiation; Optics and Application -- Far-infrared Spectroscopy on Solids under Ultra High Pressures -- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy
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https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783642405945&userID=ebsco-test&password=ebsco-test
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unknown
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{'f': 'http://opac.lib.rpi.edu/record=b3552190'}
Extent
XII, 228 p. 139 illus., 70 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783642405945
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote

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