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The Resource From contamination to defects, faults, and yield loss : simulation and applications, by Jitendra B. Khare, Wojciech Maly

From contamination to defects, faults, and yield loss : simulation and applications, by Jitendra B. Khare, Wojciech Maly

Label
From contamination to defects, faults, and yield loss : simulation and applications
Title
From contamination to defects, faults, and yield loss
Title remainder
simulation and applications
Statement of responsibility
by Jitendra B. Khare, Wojciech Maly
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
DLC
Illustrations
illustrations
Index
index present
LC call number
TK7874.75
LC item number
.K47 1996
Literary form
non fiction
Nature of contents
bibliography
Series statement
Frontiers in electronic testing
From contamination to defects, faults, and yield loss : simulation and applications, by Jitendra B. Khare, Wojciech Maly
Label
From contamination to defects, faults, and yield loss : simulation and applications, by Jitendra B. Khare, Wojciech Maly
Publication
Related Contributor
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780792397144&userID=ebsco-test&password=ebsco-test
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1337114'}
Extent
150 p.
Isbn
9780792397144
Isbn Type
(acid-free paper)
Lccn
96005441
Other physical details
ill.

Library Locations

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      42.729766 -73.682577
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