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The Resource Evaluation of advanced semiconductor materials by electron microscopy, edited by David Cherns

Evaluation of advanced semiconductor materials by electron microscopy, edited by David Cherns

Label
Evaluation of advanced semiconductor materials by electron microscopy
Title
Evaluation of advanced semiconductor materials by electron microscopy
Statement of responsibility
edited by David Cherns
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Contributor
Subject
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Series statement
NATO ASI series. Series B, Physics
Series volume
v. 203
Evaluation of advanced semiconductor materials by electron microscopy, edited by David Cherns
Label
Evaluation of advanced semiconductor materials by electron microscopy, edited by David Cherns
Publication
Note
  • 'Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom'--Verso t.p
  • 'Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee'--P. v
  • 'Published in cooperation with NATO Scientific Affairs Division.'
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Includes bibliographical references
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Dimensions
26 cm.
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{'f': 'http://opac.lib.rpi.edu/record=b1191909'}
Extent
xi, 412 p.
Isbn
9780306433627
Lccn
89-16354
Other physical details
ill.

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