Coverart for item
The Resource Ellipsometry in the measurement of surfaces and thin films; : symposium proceedings
Label
Ellipsometry in the measurement of surfaces and thin films; : symposium proceedings
Title
Ellipsometry in the measurement of surfaces and thin films;
Title remainder
symposium proceedings
Creator
Contributor
Subject
Member of
Series statement
United States. National Bureau of Standards. Miscellaneous publication
Series volume
256
Ellipsometry in the measurement of surfaces and thin films; : symposium proceedings

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
Processing Feedback ...