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The Resource EXAFS spectroscopy, techniques and applications, edited by B.K. Teo and D.C. Joy

EXAFS spectroscopy, techniques and applications, edited by B.K. Teo and D.C. Joy

Label
EXAFS spectroscopy, techniques and applications
Title
EXAFS spectroscopy, techniques and applications
Statement of responsibility
edited by B.K. Teo and D.C. Joy
Contributor
Subject
EXAFS spectroscopy, techniques and applications, edited by B.K. Teo and D.C. Joy
Label
EXAFS spectroscopy, techniques and applications, edited by B.K. Teo and D.C. Joy
Publication
Note
Based on proceedings of a symposium held at the meeting of the Materials Research Society, Nov. 26-30, 1979, in Boston
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Bibliography note
Includes bibliographical references and index
http://library.link/vocab/cover_art
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Dimensions
26 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1074649'}
Extent
viii, 275 p.
Isbn
9780306406546
Lccn
81-199
Other physical details
ill.

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