Coverart for item
The Resource Digital shearography : new developments and applications, Lianxiang Yang and Xin Xie, authors

Digital shearography : new developments and applications, Lianxiang Yang and Xin Xie, authors

Label
Digital shearography : new developments and applications
Title
Digital shearography
Title remainder
new developments and applications
Statement of responsibility
Lianxiang Yang and Xin Xie, authors
Creator
Contributor
Author
Publisher
Subject
Language
eng
Summary
It has been more than a decade since SPIE Press published the first book on shearography in 2003: Digital Shearography: Theory and Application of Digital Speckle Pattern Shearing Interferometry by Wolfgang Steinchen and Lianxiang Yang. That book has greatly contributed to enabling better understanding and improvement of the digital shearography technique. During the past 13 years, digital shearography has been widely applied by industry and accepted as a practical tool for nondestructive testing; at the same time, the technique itself has been greatly improved. This new book presents the principles and applications of phase shift digital shearography, especially spatial phase shift digital shearography, and reviews the state-of-the-art improvements and new developments of digital shearography for nondestructive testing and strain measurement. The authors provide a unified, self-contained treatment of the theory, practice, and applications of shearographic interferometry with problems and questions. The book will meet the requirements of graduate students, as well as be of assistance in research and industry applications
Member of
Additional physical form
Also available in print version.
Cataloging source
CaBNVSL
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Series statement
SPIE Press monograph
Series volume
PM267
Target audience
adult
Digital shearography : new developments and applications, Lianxiang Yang and Xin Xie, authors
Label
Digital shearography : new developments and applications, Lianxiang Yang and Xin Xie, authors
Link
http://libproxy.rpi.edu/login?url=http://dx.doi.org/10.1117/3.2235244
Publication
Copyright
Note
  • "With this book, written in memory of my PhD advisor, Professor Dr.-Ing. Wolfgang Steinchen (1939-2007)."
  • "SPIE Digital Library."--Website
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
Related Items
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type MARC source
rdacontent
Contents
Preface -- I. Fundamentals of digital shearography: 1. Review of basic optics principles; 2. Fundamentals of shearography metrology; 3. A brief review of digital shearography -- II. Temporal phase shift shearography: 4. Principles of temporal phase shift shearography; 5. Applications of temporal phase shift shearography -- III. Spatial phase shift shearography: 6. Fundamentals of spatial phase shift shearography; 7. Single-carrier-frequency spatial phase shift shearography; 8. Spatial phase shift shearography with multiple carrier frequencies; 9. Spatial phase shift shearography for strain measurement -- Summary -- Appendix: Solutions to practice problems -- Index
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9781510601574&userID=ebsco-test&password=ebsco-test
Dimensions
unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b3828842'}
Extent
1 online resource (240 pages).
File format
multiple file formats
Form of item
online
Governing access note
Restricted to subscribers or individual electronic text purchasers
Isbn
9781510601574
Media category
electronic
Media MARC source
isbdmedia
Reformatting quality
access
Specific material designation
remote
System details
  • Mode of access: World Wide Web
  • System requirements: Adobe Acrobat Reader

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
Processing Feedback ...