Coverart for item
The Resource Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms

Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms

Label
Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms
Title
Dielectric Breakdown in Gigascale Electronics
Title remainder
Time Dependent Failure Mechanisms
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
MiAaPQ
Literary form
non fiction
Nature of contents
dictionaries
Series statement
SpringerBriefs in Materials
Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms
Label
Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms
Link
http://libproxy.rpi.edu/login?url=https://ebookcentral.proquest.com/lib/rpi/detail.action?docID=4691285
Publication
Copyright
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
Related Items
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
  • Contents -- Chapter 1: Introduction -- 1.1 A Brief History of Dielectric Breakdown -- 1.2 Dielectrics and the Microprocessor Age -- 1.3 Copper, Low-kappa Dielectrics, and Current Challenges -- References -- Chapter 2: General Theories -- 2.1 Field Acceleration Models for Amorphous Thin Films -- 2.2 Emerging Models for Nano-porous Low-kappa Films -- References -- Chapter 3: Measurement Tools and Test Structures -- 3.1 Instruments and Data Acquisition -- 3.2 Metal-Insulator-Si Planar Capacitors -- 3.3 Interconnect Test Chips -- 3.4 P-cap Test Structures -- References -- Chapter 4: Experimental Techniques -- 4.1 Dielectric Breakdown Assessment -- 4.1.1 Constant Bias and Constant Current Stress Tests -- 4.1.2 Ramped Voltage and Ramped Current Stress Tests -- 4.1.3 Bipolar Applied Field Tests -- 4.2 Dielectric Characterization -- 4.2.1 Capacitance-Voltage Spectroscopy -- 4.2.2 Triangular Voltage Spectroscopy -- 4.3 Analysis of Interfacial and Bulk Dielectric Composition -- References -- Chapter 5: Breakdown Experiments -- 5.1 Intrinsic Dielectric Failure -- 5.2 Metal Ion-Catalyzed Dielectric Failure -- 5.2.1 Fundamentals of Ionic Transport -- 5.2.2 Constitutive Equation for Ions -- 5.2.3 Ionic Flux -- 5.2.4 Poissońs Equation -- 5.2.5 Boundary Conditions -- 5.2.6 RVS and Bipolar Applied Field Experiments -- 5.3 Plasma Damage and Dielectric Integrity -- References -- Chapter 6: Kinetics of Charge Carrier Confinement in Thin Dielectrics -- 6.1 Detection of Charge Trapping in Interlayer Dielectrics -- 6.2 Leakage Current Relaxation and Trapping Kinetics -- 6.3 Constitutive Equation for Electrons -- 6.4 Trapped Electrons -- 6.5 Constitutive Equation for Ions -- 6.6 Poissońs Equation -- 6.7 Boundary Conditions -- References -- Chapter 7: Theory of Dielectric Breakdown in Nano-Porous Thin Films -- 7.1 Charge Transport Fundamentals
  • 7.2 Fundamentals for a Charge Transport Model for Dielectric Breakdown -- 7.2.1 Poissońs Equation -- 7.2.2 Trap Generation -- 7.2.3 Constitutive Equation for Electrons -- 7.2.4 Boundary Conditions -- 7.2.5 Initial Conditions -- 7.3 The Hot Electron -- 7.4 Kinetics of Defect Formation and Ultimate Failure -- 7.5 Evidence for Carbon- and Porogen-Driven Failure -- References -- Chapter 8: Dielectric Breakdown in Copper Interconnects -- 8.1 Cús Impact on Dielectric Breakdown -- 8.2 Modeling Cu-Driven Dielectric Failure -- References -- Chapter 9: Reconsidering Conventional Field Acceleration Models -- 9.1 Charge Transport Model Predictions -- 9.2 New Perspectives -- References
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783319432205&userID=ebsco-test&password=ebsco-test
Dimensions
unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b4386103'}
Extent
1 online resource (109 pages)
Form of item
online
Isbn
9783319432205
Media category
computer
Media MARC source
rdamedia
Media type code
c
Sound
unknown sound
Specific material designation
remote

Library Locations

    • Folsom LibraryBorrow it
      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
Processing Feedback ...