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The Resource Design & test techniques for VLSI and WSI circuits, edited by R.E. Massara

Design & test techniques for VLSI and WSI circuits, edited by R.E. Massara

Label
Design & test techniques for VLSI and WSI circuits
Title
Design & test techniques for VLSI and WSI circuits
Statement of responsibility
edited by R.E. Massara
Creator
Subject
Member of
Series statement
IEE computing series
Series volume
15
Design & test techniques for VLSI and WSI circuits, edited by R.E. Massara
Label
Design & test techniques for VLSI and WSI circuits, edited by R.E. Massara
Publication
Note
Includes bibliographical references
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Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1192494'}
Extent
vi, 315 p.
Isbn
9780863411656
Isbn Type
:
Lccn
89-38164
Other physical details
ill.

Library Locations

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      110 8th St, Troy, NY, 12180, US
      42.729766 -73.682577
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