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The Resource Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida, Ravi Jain, editor ; sponsored by SPIE-The International Society for Optical Engineering ; cooperating sponsor, The Metallurgical Society

Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida, Ravi Jain, editor ; sponsored by SPIE-The International Society for Optical Engineering ; cooperating sponsor, The Metallurgical Society

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Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida
Title
Characterization of very high speed semiconductor devices and integrated circuits
Title remainder
23-25 March 1987, Bay Point, Florida
Statement of responsibility
Ravi Jain, editor ; sponsored by SPIE-The International Society for Optical Engineering ; cooperating sponsor, The Metallurgical Society
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Subject
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Series statement
  • Critical reviews of optical science and technology
  • SPIE
Series volume
v. 795
Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida, Ravi Jain, editor ; sponsored by SPIE-The International Society for Optical Engineering ; cooperating sponsor, The Metallurgical Society
Label
Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida, Ravi Jain, editor ; sponsored by SPIE-The International Society for Optical Engineering ; cooperating sponsor, The Metallurgical Society
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Bibliography note
Includes bibliographical references and author index
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Dimensions
28 cm.
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Extent
x, 359 p. ;
Isbn
9780892528301
Isbn Type
(pbk.) :
Lccn
87-61008
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ill. :

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