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The Resource Characterization of semiconductor heterostructures and nanostructures, edited by Carlo Lamberti

Characterization of semiconductor heterostructures and nanostructures, edited by Carlo Lamberti

Label
Characterization of semiconductor heterostructures and nanostructures
Title
Characterization of semiconductor heterostructures and nanostructures
Statement of responsibility
edited by Carlo Lamberti
Contributor
Subject
Language
eng
Cataloging source
UKM
Illustrations
illustrations
Index
index present
LC call number
QC176.8.N35
LC item number
C45 2008
Literary form
non fiction
Nature of contents
bibliography
Characterization of semiconductor heterostructures and nanostructures, edited by Carlo Lamberti
Label
Characterization of semiconductor heterostructures and nanostructures, edited by Carlo Lamberti
Publication
Related Contributor
Related Location
Related Agents
Related Authorities
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Bibliography note
Includes bibliographical references and index
Contents
  • Transmission electron microscopy techniques for imaging and compositional evaluation in semiconductor heterostructures
  • Laura Lazzarini, Lucia Nasi, and Vincenzo Grillo
  • Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence
  • Stefano Sanguinetti, Mario Guzzi, and Massimo Gurioli
  • Power-dependent cathodoluminescence in III-nitrides heterostructures: from internal field screening to controlled band-gap modulation
  • Giancarlo Salviati, Francesca Rossi, Nicola Armani, Vincenzo Grillo, and Laura Lazzarini
  • Raman spectroscopy
  • Daniel Wolverson
  • X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures
  • Federico Boscherini
  • Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques
  • Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering
  • Till Metzger, Vincent Favre-Nicolin, Gilles Renaud, Hubert Renevier, and Tobias Schülli
  • Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures
  • Maria Grazia Proietti, Johann Coraux, and Hubert Renevier
  • The role of photoemission spectroscopies in heterojunction research
  • Giorgio Margaritondo
  • ESR of interfaces and nanolayers in semiconductor heterostructures
  • Andre Stesmans and Valery V. Afanasʹev
  • Carlo Lamberti
  • Ab initio studies of structural and electronic properties
  • Maria Peressi, Alfonso Baldereschi, and Stefano Baroni
  • Electrical characterization of nanostructures
  • Anna Cavallini and Laura Polenta
  • Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction
  • Claudio Ferrari and Claudio Bocchi
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9780444530998&userID=ebsco-test&password=ebsco-test
Dimensions
25 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b2529847'}
Edition
1st ed.
Extent
ix, 486 p., [3] p. of plates
Isbn
9780444530998
Isbn Type
(hbk.)
Other physical details
ill. (some col.)
System control number
(OCoLC)214306811

Library Locations

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      42.729766 -73.682577
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