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The Resource Characterization of crystal growth defects by X-ray methods : (proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom), edited by Brian K. Tanner and D. Keith Bowen

Characterization of crystal growth defects by X-ray methods : (proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom), edited by Brian K. Tanner and D. Keith Bowen

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Characterization of crystal growth defects by X-ray methods : (proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom)
Title
Characterization of crystal growth defects by X-ray methods
Title remainder
(proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom)
Statement of responsibility
edited by Brian K. Tanner and D. Keith Bowen
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Series statement
NATO advanced study institutes series. Series B, Physics
Series volume
v. 63
Characterization of crystal growth defects by X-ray methods : (proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom), edited by Brian K. Tanner and D. Keith Bowen
Label
Characterization of crystal growth defects by X-ray methods : (proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom), edited by Brian K. Tanner and D. Keith Bowen
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'Published in cooperation with NATO Scientific Affairs Division.'
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Includes bibliographical references and indexes
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Dimensions
26 cm.
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{'f': 'http://opac.lib.rpi.edu/record=b1155706'}
Extent
xxvi, 589 p.
Isbn
9780306406287
Lccn
80-26509
Other physical details
ill.

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