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The Resource Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts, Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing / Carnegie Mellon University ... (et al.)

Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts, Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing / Carnegie Mellon University ... (et al.)

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Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts
Title
Automated inspection and high speed vision architectures
Title remainder
3-4 November 1987, Cambridge, Massachusetts
Statement of responsibility
Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing / Carnegie Mellon University ... (et al.)
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Proceedings of SPIE--the International Society for Optical Engineering
Series volume
v. 849
Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts, Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing / Carnegie Mellon University ... (et al.)
Label
Automated inspection and high speed vision architectures : 3-4 November 1987, Cambridge, Massachusetts, Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing / Carnegie Mellon University ... (et al.)
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Bibliography note
Includes bibliographical references and index
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Dimensions
28 cm.
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{'f': 'http://opac.lib.rpi.edu/record=b1170130'}
Extent
vi, 274 p.
Isbn
9780892528844
Isbn Type
(pbk.) :
Lccn
87-63195
Other physical details
ill.

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