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The Resource Advanced characterization techniques for thin film solar cells, edited by Daniel Abou-Ras, Thomas Kirchartz, and Uwe Rau, (electronic resource)

Advanced characterization techniques for thin film solar cells, edited by Daniel Abou-Ras, Thomas Kirchartz, and Uwe Rau, (electronic resource)

Label
Advanced characterization techniques for thin film solar cells
Title
Advanced characterization techniques for thin film solar cells
Statement of responsibility
edited by Daniel Abou-Ras, Thomas Kirchartz, and Uwe Rau
Contributor
Subject
Genre
Language
eng
Cataloging source
DG1
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Advanced characterization techniques for thin film solar cells, edited by Daniel Abou-Ras, Thomas Kirchartz, and Uwe Rau, (electronic resource)
Label
Advanced characterization techniques for thin film solar cells, edited by Daniel Abou-Ras, Thomas Kirchartz, and Uwe Rau, (electronic resource)
Link
http://libproxy.rpi.edu/login?url=http://dx.doi.org/10.1002/9783527636280
Publication
Related Contributor
Related Location
Related Agents
Related Authorities
Related Subjects
Bibliography note
Includes bibliographical references and index
Color
multicolored
Contents
Introduction. Introduction to Thin-Film Photovoltaics / Thomas Kirchartz, Uwe Rau -- Device Characterization. Fundamental Electrical Characterization of Thin-Film Solar Cells / Thomas Kirchartz, Kaining Ding, Uwe Rau -- Electroluminescence Analysis of Solar Cells and Solar Modules / Thomas Kirchartz, Anke Helbig, Bart E Pieters, Uwe Rau -- Capacitance Spectroscopy of Thin-Film Solar Cells / Jennifer Heath, Pawel Zabierowski -- Materials Characterization. Characterizing the Light-Trapping Properties of Textured Surfaces with Scanning Near-Field Optical Microscopy / Karsten Bittkau -- Spectroscopic Ellipsometry / Sylvain Marsillac, Michelle N Sestak, Jian Li, Robert W Collins -- Photoluminescence Analysis of Thin-Film Solar Cells / Thomas Unold, Levent Gutay -- Steady-State Photocarrier Grating Method / Rudolf Bruggemann -- Time-of-Flight Analysis / Torsten Bronger -- Electron-Spin Resonance (ESR) in Hydrogenated Amorphous Silicon (a-Si:H) / Klaus Lips, Matthias Fehr, Jan Behrends -- Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells / Sascha Sadewasser, Iris Visoly-Fisher -- Electron Microscopy on Thin Films for Solar Cells / Daniel Abou-Ras, Melanie Nichterwitz, Manuel J Romero, Sebastian S Schmidt -- X-Ray and Neutron Diffraction on Materials for Thin-Film Solar Cells / Susan Schorr, Christiane Stephan, Tobias Torndahl, Roland Mainz -- Raman Spectroscopy on Thin Films for Solar Cells / Jacobo Alvarez-Garcia, Victor Izquierdo-Roca, Alejandro Perez-Rodriguez -- Soft X-Ray and Electron Spectroscopy: A Unique 'Tool Chest' to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces / Marcus Bar, Lothar Weinhardt, Clemens Heske -- Elemental Distribution Profiling of Thin Films for Solar Cells / Volker Hoffmann, Denis Klemm, Varvara Efimova, Cornel Venzago, Angus A Rockett, Thomas Wirth, Tim Nunney, Christian A Kaufmann, Raquel Caballero -- Hydrogen Effusion Experiments / Wolfhard Beyer, Florian Einsele -- Materials and Device Modeling. Modeling of Defects in Semiconductors / Karsten Albe, Peter Agoston, Johan Pohl -- One-Dimensional Electro-Optical Simulations of Thin-Film Solar Cells / Bart E Pieters, Koen Decock, Marc Burgelman, Rolf Stangl, Thomas Kirchartz -- Two- and Three-Dimensional Electronic Modeling of Thin-Film Solar Cells / Ana Kanevce, Wyatt K Metzger
http://library.link/vocab/cover_art
https://contentcafe2.btol.com/ContentCafe/Jacket.aspx?Return=1&Type=S&Value=9783527636280&userID=ebsco-test&password=ebsco-test
Dimensions
unknown
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b3113120'}
Extent
xxxvi, 547 p.
Form of item
online
Isbn
9783527636280
Isbn Type
(electronic bk.)
Reproduction note
Electronic reproduction.
Specific material designation
remote
System control number
(OCoLC)714799132

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