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The Resource Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974, Philip D. LaFleur, editor

Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974, Philip D. LaFleur, editor

Label
Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974
Title
Accuracy in trace analysis
Title remainder
sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974
Statement of responsibility
Philip D. LaFleur, editor
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Member of
Series statement
NBS special publication
Series volume
422
Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974, Philip D. LaFleur, editor
Label
Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974, Philip D. LaFleur, editor
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Bibliography note
Includes bibliographical references
Dimensions
24 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1006060'}
Extent
v.
Lccn
75-619250
Other physical details
ill.

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