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The Resource Accelerated testing : statistical models, test plans and data analyses, Wayne Nelson

Accelerated testing : statistical models, test plans and data analyses, Wayne Nelson

Label
Accelerated testing : statistical models, test plans and data analyses
Title
Accelerated testing
Title remainder
statistical models, test plans and data analyses
Statement of responsibility
Wayne Nelson
Creator
Subject
Member of
Series statement
Wiley series in probability and mathematical statistics. Applied probability and statistics
Accelerated testing : statistical models, test plans and data analyses, Wayne Nelson
Label
Accelerated testing : statistical models, test plans and data analyses, Wayne Nelson
Publication
Note
'A Wiley-Interscience publication.'
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Bibliography note
Includes bibliographical references (p. 561-577)
http://library.link/vocab/cover_art
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Dimensions
25 cm.
http://library.link/vocab/discovery_link
{'f': 'http://opac.lib.rpi.edu/record=b1193171'}
Extent
xiv, 601 p.
Isbn
9780471522775
Lccn
89-24853
Other physical details
ill.

Library Locations

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